2022 Computer Vision Conference Paper

Fabric Defect Detection Using Gray Level Co-occurrence Matrix and Local Binary Pattern

Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, et al., Loh Ing Hoe

Conference proceedings

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Abstract

Applies Gray Level Co-occurrence Matrix (GLCM) and Local Binary Pattern (LBP) texture-analysis techniques to automated fabric defect detection.

Keywords

Computer VisionDefect DetectionTexture Analysis

APA-style Citation

Ushik Shrestha Khwakhali, Nguyen Thu Tra, Huynh Vinh Tin, et al., Loh Ing Hoe (2022). Fabric Defect Detection Using Gray Level Co-occurrence Matrix and Local Binary Pattern. Conference proceedings.

BibTeX

@inproceedings{Khwakhali2022fabric,
  author    = {Ushik Shrestha Khwakhali and Nguyen Thu Tra and Huynh Vinh Tin and Loh Ing Hoe},
  title     = {Fabric Defect Detection Using Gray Level Co-occurrence Matrix and Local Binary Pattern},
  year      = {2022},
  booktitle = {Conference proceedings},
  url       = {https://www.researchgate.net/publication/367263530_Fabric_Defect_Detection_Using_Gray_Level_Co-occurence_Matrix_and_Local_Binary_Pattern}
}